25 results
Raman Spectroscopy and Electron Microscopy Studies of Ga FIB and Post-FIB Ar Ion Milling's Impact on Si TEM Specimens
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 52-53
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- August 2022
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Site-specific Sample Preparation by Concentrated Ar Ion Milling for Post-mortem Atomic Resolution Imaging of Rapidly Solidified Al-Cu Thin Films After Pulsed Laser Melting
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 124-125
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- August 2022
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Argon Milling of Bulk and Post-FIB Specimens for Multi-Length Scale Analyses by EBSD, TEM, and APT under Controlled Environments
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 3176-3178
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- August 2022
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Post-FIB Specimen Preparation of Atom Probe Specimens under Controlled Environments for Correlative Microscopy
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 2554-2555
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- August 2019
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Controlled Environments from Sample Preparation to Electron Microscopy Characterization
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 698-699
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- August 2019
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SEM and TEM characterization of plastic deformation structures in Aluminum by EBSD, TKD, and PED-based orientation imaging techniques
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 2182-2183
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- August 2018
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Automatic End-point Detection for Ar+ Milling of FIB in situ and ex situ Lift-out Specimens from Semiconductor Devices
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 854-855
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- August 2018
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Narrow-Beam Argon Ion Milling of Carbon-Supported Ex Situ Lift-Out FIB Specimens
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 302-303
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- July 2017
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Large Area 3D Structural Characterization by Serial Sectioning Using Broad Ion Beam Argon Ion Milling
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 12-13
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- July 2017
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Accurate Removal of Implanted Gallium and Amorphous Damage from TEM Specimens after Focused Ion Beam (FIB) Preparation
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 300-301
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- July 2017
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Advanced Characterization of Emerging Semiconductor Devices Using Low Energy, Broad Ion Beam Argon Milling
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1408-1409
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- July 2017
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Targeted Ion Milling of Ex Situ Lift-Out FIB Specimens
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 268-269
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- July 2017
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Towards Quantitative 3D Chemical Analysis in TEM Using Quadrant XEDS Detector Geometry
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 762-763
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- August 2014
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Investigations on the Microstructure and Microanalysis of the Gas Shale Sample Prepared by SEM Ion Mill by Off-Centering the Ion Beams
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 2108-2109
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- August 2014
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Characterization of Shales by Mass Spectrometry during Ion Milling
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1724-1725
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- August 2014
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Concentrated Ar Ion Milling for Aberration - Corrected Electron Microscopy: A Review
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 632-633
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- July 2011
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Preparation of Materials for EBSD using an Adjustable Broad Beam Ion Source
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 390-391
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- July 2011
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Raising the Standard of Specimen Preparation for Aberration-Corrected TEM and STEM
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- Microscopy Today / Volume 19 / Issue 1 / January 2011
- Published online by Cambridge University Press:
- 11 January 2011, pp. 16-19
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- January 2011
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Sample Preparation for Aberration Corrected Microscopy
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 998-999
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- August 2008
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Automated Sample Preparation of Low-k Dielectrics for FESEM
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 2108-2109
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- August 2005
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